Sofics downloads

data sheet

brochure

white paper

journal/conference paper

  • 2012 Taiwan ESD conference paper on scaling trends
  • 2012 Taiwan ESD conference paper on Electrical Overstress
  • 2012 Taiwan ESD conference paper on Dynamic Avalanche
  • 2012 EETimes article: On-chip ESD protection for High Voltage applications in TSMC BCD technology
  • 2012 IC Journal article: SCR based on-chip ESD protection for LNA’s in 40nm CMOS
  • Taiwan ESD 2011 conference paper on ESD protection for TSMC BCD processes
  • Taiwan ESD 2011 conference invited paper on Overvoltage, failsafe, open drain
  • RCJ 2011 conference paper on the impact of 10 years of CMOS scaling on ESD
  • RCJ 2011 conference paper on 3.3V interfaces in 40nm and 28nm
  • TSMC OIP 2011 paper on ESD protection for TSMC BCD processes
  • EOS/ESD 2011 conference paper on 3.3V interfaces in 40nm
  • Taiwan ESD 2010 conference paper on ESD protection of LNA circuits
  • Taiwan ESD 2010 conference paper on ESD protection for high voltage
  • IEW 2010 workshop discussion on improved HHISCR devices
  • EOS/ESD 2010 conference paper on improved HHISCR devices
  • RCJ 2009 conference paper on ESD protection for HDMI interfaces
  • IEW 2009 workshop discussion on TakeCharge calculation tool
  • SOC 2008 conference publication on ESD challenges in Advanced CMOS
  • RCJ 2008 conference paper on improving SCR concepts - joint paper with OKI
  • RCJ 2008 conference paper on latch-up analysis - joint paper with NJR
  • IPSOC 2008 conference paper on the TakeCharge calculation tool
  • EOS/ESD 2008 conference paper on CDM analysis - joint paper with Fujitsu
  • EOS/ESD 2007 conference paper on transient analysis of SCR based protection concepts
  • RCJ 2006 conference paper on Very Fast TLP analysis techniques
  • JMR 2006 journal paper on ESD protection for high voltage technology
  • EOS/ESD 2006 conference paper on bulk coupled MOS in SOI
  • Taiwan ESD 2005 Keynote
  • TMDR 2005 journal paper on Diode Triggered SCR
  • RCJ 2005 conference paper on ESD solutions for EPI technology
  • ISCAS 2005 conference paper on Diode Triggered SCR
  • EOS/ESD 2005 conference paper on SCR porting to SOI
  • EOS/ESD 2005 conference paper on Current Triggered SCR
  • CICC 2005 conference paper on SCR protection concepts
  • EOS/ESD 2004 conference paper on ESD protection for high voltage technologies
  • CICC 2004 conference paper on Active Source Pumping
  • IEDM 2003 conference paper on Diode Triggered SCR
  • EOS/ESD 2003 conference paper on Active Area Segmentation
  • EOS/ESD 2002 conference paper on High Holding Current SCR
  • EOS/ESD 2001 conference paper on Multi Finger Triggering concepts
  • EOS/ESD 2001 conference paper on GGSCR
  • EOS/ESD 2000 conference paper on Back en Ballasting
    • press release

    • 2014 Sofics® wins industry significant award at the European Patent Office
    • 2014 Lantiq Licenses Sofics on-chip ESD Solutions
    • 2013 press release with ZMDI
    • 2012 press release with Arquimea
    • 2012 press release with RUAG
    • 2012 press release with ADI
    • 2012 press release with Anvo Systems
    • 2012 press release with Nvidia and ICsense
    • 2012 press release with DecaWave
    • 2012 press release on TSMC9000 achievements
    • 2012 press release with eSilicon on PowerQubic
    • 2011 press release with StarChip
    • 2011 press release with ICsense on cooperation achievements
    • 2010 press release with TSMC - PowerQubic license
    • 2009 press release on RCJ award
    • 2009 press release on ESDA awards
    • 2009 press release on Sofics changes
    • 2009 press release on the Management Buy Out
    • 2009 press release with Etesian
    • 2009 press release with UMC - new processes covered
    • 2008 press release on new ESD services
    • 2008 press release on TSMC 40nm solutions
    • 2008 press release on TSMC DCA partnership
    • 2008 press release with Toshiba
    • 2008 press release with Redmere
    • 2008 press release with Actel
    • 2007 press release on winning the Nippon export award
    • 2007 press release for Taiwan
    • 2007 press release with AMIS
    • 2007 press release at FSA
    • 2007 press release with Tower Semiconductor
    • 2007 press release about UMC IP alliance
    • 2006 press release with Fujitsu
    • 2006 press release with EPSON-SEIKO foundry
    • 2005 press release with Toshiba
    • 2005 press release with OKI
    • 2005 press release with EPSON-SEIKO
    • 2004 press release with Panasonic
    • 2004 press release with Renesas
    • 2004 press release with Ricoh
    • 2004 press release with Altera
    • 2004 press release with Toshiba
    • 2002 press release with NJR
      • patent