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Optimized Local I/O ESD Protection for SerDes In Advanced SOI, BiCMOS and FinFET Technology

by Bart Keppens
Posted on August 9, 2022
in CMOS, DTSCR, ESD devices, ESD protection, FinFET, Local clamp, Low capacitance ESD, Optical communication, Paper, SCR, SerDES, SiGe BiCMOS, Silicon controlled rectifier, SOI, TakeCharge, Wired communication

Sofics' 2021 IEDS publication. Semiconductor companies are developing ever faster interfaces to satisfy the need for higher data throughputs. However, the parasitic capacitance of the traditional ESD solutions limits the signal frequency. This paper demonstrates low-cap Analog I/Os for high speed SerDes (28Gbps to 112Gbps) circuits created in advanced BiCMOS, SOI and FinFET nodes.

by Bart Keppens
Posted on May 27, 2022
in Automotive, CMOS, Display, EOS, ESD design window, ESD protection, ESD protection approaches, ESD testing, High Voltage, High voltage tolerance, IEC 61000-4-5, Local clamp, Over voltage tolerant, overvoltage tolerant, PowerQubic, TakeCharge

EOS, or Electrical Overstress, is any electrical stress that exceeds any of the specified absolute maximum ratings (AMR) of a product. It is important to discuss because many products are damaged this way. This article includes case studies and 3 approaches to handle those requests.

by Bart Keppens
Posted on May 18, 2022
in Automotive, CMOS, dual diode, ESD protection, ESD protection approaches, Ethernet, FinFET, High ESD or IEC 61000-4-2 robustness, High speed interfaces, Local clamp, Low capacitance ESD, SerDES, TakeCharge, Wired communication

In the past most Electronic Control Units (ECU) used CAN and LIN interfaces to connect to sensors, actuators and each other. However, the newest applications need (much) faster communication options. Gigabit automotive ethernet is pushed by many in the industry as the perfect solution. With its local ESD clamp approach, Sofics provides the best solution[...]

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