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Increase your IC robustness
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ESD/EOS/latch up/radiation/EMC
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Any specification
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Any level
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Protection for low voltage
and advanced processes
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Case Study
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Any ESD model
Any level
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Human Body Model (HBM)
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Machine Model (MM)
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Charge Device Model (CDM)
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System level ESD on-chip
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Hand Metal Model (HMM)
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Cable Discharge Model (CDE)
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Any disturbance
Any level
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Static latch up: JEDEC78
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Transient latch up
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Electrical OverStress (EOS): IEC 61000-4-5...
Protection for high voltage
and BCD processes

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Case Study
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Any ESD model
Any level
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Human Body Model (HBM)
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Machine Model (MM)
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Charge Device Model (CDM)
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System level ESD
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Hand Metal Model (HMM)
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Cable Discharge Model (CDE)
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Any disturbance
Any level
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Electrostatic Discharge (ESD):
HBM, MM, CDM, system level, ...
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Static & transient latch up
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Electrical Overstress (EOS): IEC 61000-4-5,...
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Automotive pulses: ISO 7637-2 & -3, ...
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EMC (EMI): IEC 62312, ISO 16750...
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Circuit design
with integrated robustness
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Leveraged from TakeCharge and PowerQubic
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Any specification, any disturbance
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Circuit design
for higher robustness
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Clipping circuit to protect IO
from high voltages