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  • Increase your IC robustness


  • ESD/EOS/latch up/radiation/EMC


  • Any specification

  • Any level


  • Datasheet

  • Protection for low voltage
    and advanced processes

  • TakeCharge Logo

  • Case Study

  • Any ESD model
    Any level

  • Human Body Model (HBM)

  • Machine Model (MM)

  • Charge Device Model (CDM)

  • System level ESD on-chip

  • Hand Metal Model (HMM)

  • Cable Discharge Model (CDE)

  • Any disturbance
    Any level

  • Static latch up: JEDEC78

  • Transient latch up

  • Electrical OverStress (EOS): IEC 61000-4-5...

  • Protection for high voltage
    and BCD processes

  • PowerQubic Logo

  • Case Study

  • Any ESD model
    Any level

  • Human Body Model (HBM)

  • Machine Model (MM)

  • Charge Device Model (CDM)

  • System level ESD

  • Hand Metal Model (HMM)

  • Cable Discharge Model (CDE)


  • Any disturbance
    Any level

  • Electrostatic Discharge (ESD):
    HBM, MM, CDM, system level, ...

  • Static & transient latch up

  • Electrical Overstress (EOS): IEC 61000-4-5,...

  • Automotive pulses: ISO 7637-2 & -3, ...

  • EMC (EMI): IEC 62312, ISO 16750...

  • Circuit design
    with integrated robustness

  • Leveraged from TakeCharge and PowerQubic

  • Any specification, any disturbance

  • Circuit design
    for higher robustness

  • Clipping circuit to protect IO
    from high voltages